On-chip Clock Controller - VLSI Tutorials
On-chip Clock Controllers (OCC) are also known as Scan Clock Controllers (SCC). OCC is the logic inserted on the SOC for controlling clocks during silicon testing on ATE (Automatic test Equipment).
DFT1.OCC电路浅析 - 知乎 - 知乎专栏
OCC的基本原理是在scan shift模式下，选通慢速的ATE时钟进行load测试向量和unload测试结果，在capture模式下，对free-running的PLL clock过滤筛选launch和capture clock进行at-speed测试。 常用的OCC电路结构： 续上文，在做SCAN的时候，由于ATE无法提供同片内高频时钟一样的时钟源，因此此时需要使用芯片内部的高频时钟。 在capture的时候，对于内部寄存器而言，到达ck pin上的时钟为function时的高频时钟，在shift的时候，shift clock为ATE产生的低频时钟。 …
OCC的架构功能介绍以及插入 - 知乎 - 知乎专栏
片上时钟控制器 (On-chip Clock Controllers ，OCC)，也称为扫描时钟控制器 (Scan Clock Controllers，SCC)。 OCC 是插在SoC上的逻辑电路。 在ATE（自动测试设备）上对芯片做ATPG测试时，OCC用于控制内部scan flip-flop时钟。 OCC电路可以实现ate clock和function clock之间的切换，并且控制在什么时刻跳转。 所以standard的OCC在设计时需要拥有三个主要功能： clock selection, clock chopping control and clock gating。 这里我们会介绍一 …
Scan Clocking Architecture – VLSI Tutorials
Then we need to modify the clocking architecture to add an On-chip Clock Controller (OCC) for every clock domain, as shown in Figure 4. We have six clock domains, thus six OCCs. As discussed here, the OCC controls the clock operation required for testing a circuit.
Scan Insertion & Scan Compression with OCC - ChipEdge VLSI …
Scan Insertion and Scan Compression with OCC: This Course will enlighten the learners about scan design for testing or Design for Testability. The learners will get an idea about the role of DFT Engineers in each stage of chip life cycle.
Design clock controllers for hierarchical test - EDN
Jul 18, 2014 · The OCC clock waveforms need to be known during block-level ATPG. Block-level patterns are created in separate sets of patterns, one for each clock waveform. The Mentor tool's term for this type of restricted clock waveform is a “named capture procedure.”
Abstract—In this paper, an on-chip clock (OCC) controller with bypass function based on an internal phase-locked loop (PLL) is designed to test the faults in system on chip (SOC), such as the transition-delay faults and the stuck-at faults.
DFT test-OCC circuit introduction - Programmer Sought
DFT test-OCC circuit introduction. SCAN technology, that is, ATPG technology-testing std-logic, the main implementation tools are: generating ATPG using Mentor's TestKompress and synopsys TetraMAX; inserting scan chain mainly uses synopsys' DFT compiler.
DFT - VLSI Tutorials
DFT, Scan & ATPG. What is DFT; Fault models; Basics of Scan; How test clock is controlled for Scan Operation using On-chip Clock Controller. Why do we need OCC; How test clock is controlled by OCC; Example of a simple OCC with its systemverilog code; How to define a clock architecture for Scan. How to handle clock mux and clock divider; How to ...
Internally Generated Scan Resets Using OCC
Sep 30, 2024 · So, to overcome these limitations, a DfT architecture is defined which generates scan reset internally using OCC. Keyphrases: DFT Architecture, Hierarchical compatible Test, Internal Scan Resets, Low Pin Test, Retention flipflop, capture window, clock pad, enable to block, mini-OCC, provide internal scan reset, race conditions, reset n and ...