Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging. Two types of testing are typically done. Very basic wafer …

Wafer sort is a simple electrical test, that is perform on a silicon die while it’s in a wafer form. Wafer sort’s main purpose is to identify the non-functional dies and thereby avoiding assembly …

If you're interested in separating silicon ingots from test grade wafers, you need to know how to perform automatic silicon-wafer sorting. There are several methods of sorting silicon, including …

Wafer sort is a crucial process in semiconductor wafer processing facilities. It is the first testing stop for completed wafers. The test results provide valuable feedback to multiple departments …

Micross has extensive experience and in-house expertise to design test programs and perform the wafer testing and sorting using our state-of-the-art Accretech 8” and 12” wafer probers.

Process wafers from wafer sort to assembly without INK! • Electronic Wafer Maps identify passing and failing dice on each wafer • Visual Inspection rejects identified on wafer maps • It is NOT a …

Wafer Test (also referred to as Wafer Probe) is a vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD). It involves …

Wafer Sort process done with the presence of equipment called wafer prober and Tester. A wafer prober is an equipment where the wafers will be handled inside by the prober to be placed on …

Wafer Test & Sort Probe Testing. Wafer-level probe testing applies a programmed test pattern to each die on the wafer to collect data about the electrical circuit. Spirit offers a vast array of …

The Wafer Sort Controller (WSC) is a cost effective wafer probe test cell control system that manages the complete wafer test process and production flow. This generic tool enables the …