Smart probe cards help to achieve higher accuracies by precision controlled sensor excitation. They can also reduce test complexity and effort. Still wafer probing of sensor devices is a challenge: •In some physical domains it remains difficult to …

探针卡是一种测试接口，主要对裸芯进行测试，即wafer level测试。 探针卡上的探针与芯片上的pad或bump接触，引出芯片讯号，再配合周边测试仪器与软件控制达到自动化量测的目的。 Probe card是由探针（probe pin）、电子元件（component）、线材（wire）与印刷电路板（PCB）组成。 目前常用的针卡有 悬臂针卡 、 垂直针卡，两者的主要特性对比如下： 悬臂针卡. 垂直针卡. 针卡设计. CP针卡设计需要的相关信息，看到的资料是英文信息，为了不导致专有名词翻译造成 …

Probe cards or DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used. One type of DUT board is used for testing the individual die of a silicon wafer before they are cut free and packaged, and another type is used for testing packaged IC's.

Probe Card A: Spider Stiffener Heat shielded Probe Card B: Bridge Stiffener Independent of probe card type (cantilever or vertical)

From blade probes to cantilever spider, from cobra to MEMS; for over 20 years, Test21 has been the trusted partner in probe card PCB development and manufacturing. Our expertise in high speed and dynamic current applications greatly benefit mission critical direct probe projects.

seamless integration of wafer probes (needle spider, vertical probe heads, stiffeners...) Manual assembly (Through-hole, SMD, cabling, mechanical...) Full component test - based on PCB design source-data! We manufacture highly reliable and customized microchip Test Boards for semiconductor test.

The MultiplexerTM probe card provides an ideal solution for CIS cantilever-type probe card general concerns. Adapts to high speed or multi-DUT requirements. ACTM probe – low contact force, good Cres & small probe scrub. Well-known cantilever style – easy handling for operators.

Epoxy ring probe cards from 1 to 550 probes are in regular production here at Alpha Probes. Semiconductor cards with pitches down to 50µm, designs using multi-tier needles, and multi-die configurations are offered.

Testprobe We support selling offer the cantilever and vertical probe cards with various probe including WRe, CIS , Cobra, hbc, Bc,… for wafer yield testing.

A probe card is a jig used for electrical testing of an LSI (large-scale integrated circuit) chip on a wafer during the wafer test process in LSI manufacturing. A probe card is docked to a wafer prober to serve as a connector between the LSI chip electrodes and an LSI tester as a …