A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...

Probe cards link automatic test equipment (ATE) to semiconductor wafers with aligned microscopic probes to touch individual die pads. It enables high-fidelity electrical testing of integrated circuits before dicing and packing.

A probe card is an electromechanical interface that allows testing the functioning of a chip when it is still on the wafer or before it is individually packaged. How does it do this? The probe card makes contact with the pads or bumps of the chips.

But what exactly is a probe card, and why is probe card measurement so critical? In this article, we’ll delve into the basics of probe cards, explore their types and applications, and uncover the significance of probe card metrology and measurement systems.

Many different types of probe cards are manufactured, including epoxy, blade, vertical, array, multi-DUT, micro-spring, etc. In this tutorial, the discussion will be limited to epoxy and blade probe cards because they are the types most commonly used for parametric test.

Jan 3, 2024 · At its core, a probe card is a device used in semiconductor testing to assess the functionality and performance of integrated circuits (ICs) during the production process. Essentially, it...

Many different types of probe cards are manufactured, including epoxy, blade, vertical, array, multi-DUT, micro-spring, etc. In this tutorial, the discussion will be limited to epoxy and blade probe cards because they are the types most commonly used for parametric test.

Sep 3, 2024 · A probe card is an interface used to test the functions, parameters, and performance levels of chips and integrated circuits before they are manufactured in the market. It is considered an advanced device that takes action to inspect potential risks deeply, errors, and other readings with the assistance of a wafer and probe.

Types of Probe Cards: Tailoring Solutions for Diverse Needs. Cantilever Probe Cards. Spring-Loaded Precision: Delving into the mechanics of cantilever probe cards, which utilize spring-loaded needles to establish contact with semiconductor devices for testing.

A probe card is essentially an interface or a board that is used to perform wafer test for a semiconductor wafer. It is used to connect to the integrated circuits located on a wafer to the ATE (Automated Test Equipment) in order to test their electrical parameters and performance before they are manufactured and shipped out.