A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...

Many different types of probe cards are manufactured, including epoxy, blade, vertical, array, multi-DUT, micro-spring, etc. In this tutorial, the discussion will be limited to epoxy and blade probe cards because they are the types most commonly used for parametric test.

FormFactor’s family of optical device probe cards offer customized solutions for testing CMOS image sensors and LED devices. FormFactor’s Hikari probe card solution delivers excellent light uniformity, low power noise within the DUT and across the array, with minimal pad damage.

MPI's Probe Card division offers innovative solutions for semiconductor testing, ensuring high performance and reliability in electronic devices.

During testing, the probe card and IC are held in place by another machine, called a prober. The prober might be described as the "arm" of a tester, doing the mechanical work of moving and aligning the probe card and IC.

Customized Cantilever and Vertical Probe Card technologies including full PCB design, mechanical components and additional funcionalities on Probe Card.

A probe card is an electromechanical interface that allows testing the functioning of a chip when it is still on the wafer or before it is individually packaged. How does it do this? The probe card makes contact with the pads or bumps of the chips.

Probe card technology has struggled to keep pace with increasing frequencies and speeds. The card styles and connectors that are required are changing the character of the probe industry from off-the-shelf generic probe cards to application-specific custom probe card designs.

Jan 3, 2024 · At its core, a probe card is a device used in semiconductor testing to assess the functionality and performance of integrated circuits (ICs) during the production process. Essentially, it serves...

A probe card is essentially an interface or a board that is used to perform wafer test for a semiconductor wafer. It is used to connect to the integrated circuits located on a wafer to the ATE (Automated Test Equipment) in order to test their electrical parameters and performance before they are manufactured and shipped out.