This application note provides a Failure Modes and Effects Analysis (FMEA) for the device pins of the TPS386000-Q1 quad-supply voltage-supervisor device with programmable delay and watchdog timer.

in this document include the typical pin-by-pin failure scenarios: • Pin short-circuited to Ground (see Table 4-2) • Pin open-circuited (see Table 4-3) • Pin short-circuited to an adjacent pin (see Table 4-4) • Pin short-circuited to supply (see Table 4-5)

Bent pin analysis is a special kind of failure mode and effect analysis (FMEA) performed on electrical connectors, and by extension it can also be used for FMEA of interface wiring.

This chapter provides an FMEA (Failure Mode and Effect Analysis) for typical failure situations for the NX3P high-side load switch family. The failure occurs when the pins in the logic controlled power switch, are short circuited to supply IO, GND or neighboring pins or simply left open.

Jul 19, 2021 · This application note provides a Failure Modes and Effects Analysis (FMEA) for the device pins of the ISL3160E 5V, 40Mbps, full-duplex RS-485 transceiver. The failure conditions covered in this document include failure scenarios such as short-circuits to VCC, GND, and adjacent pins, and if the pin is left open.

INA240-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMEA (Rev. A) This document contains information for INA240-Q1 (TSSOP-8 and SOIC-8 packages) to aid in a functional safety system design. Information provided are: Figure 1 shows the device functional block diagram for reference. Figure 1. Functional Block Diagram.

LMR14030: Pin FMEA The information contained in this test report is complimentary to the LMR14020/30/50 datasheets and application notes. TABLE 1 – PIN FMEA ANALYSIS FOR PIN SHORT-CIRCUIT TO GND Pin Short to GND Number Name Risk of Device Damage Effect on Functionality Comments 1 BOOT No risk YES VOUT not present. HS switch does not turn on.

This application note provides a Failure Modes and Effects Analysis (FMEA) for the device pins of the NXP Semiconductor AUP fam ily under typical failure situations such as a short-circuit to V DD or V SS or to a neighboring pin, or if a pin is left open.

4 Pin Failure Mode Analysis (Pin FMA) This section provides a failure mode analysis (FMA) for the pins of the TPS784-Q1 ( VSON and SOT-23 packages). The failure modes covered in this document include the typical pin-by-pin failure scenarios: • Pin short-circuited to ground (see Table 4-2 , Table 4-6 , and Table 4-10 )

This application note provides a Failure Modes and Effects Analysis (FMEA) for the device pins of Nexperia’s AUP family under typical failure situations such as a short-circuit to VCC or GND or to a neighboring pin, or if a pin is left open.