On-chip Clock Controllers (OCC) are also known as Scan Clock Controllers (SCC). OCC is the logic inserted on the SOC for controlling clocks during silicon testing on ATE (Automatic test …

OCC的基本原理是在scan shift模式下，选通慢速的ATE时钟进行load测试向量和unload测试结果，在capture模式下，对free-running的PLL clock过滤筛选launch和capture clock进行at-speed …

片上时钟控制器 (On-chip Clock Controllers ，OCC)，也称为扫描时钟控制器 (Scan Clock Controllers，SCC)。 OCC 是插在SoC上的逻辑电路。 在ATE（自动测试设备）上对芯片 …

Then we need to modify the clocking architecture to add an On-chip Clock Controller (OCC) for every clock domain, as shown in Figure 4. We have six clock domains, thus six OCCs. As …

Scan Insertion and Scan Compression with OCC: This Course will enlighten the learners about scan design for testing or Design for Testability. The learners will get an idea about the role of …

Jul 18, 2014 · The OCC clock waveforms need to be known during block-level ATPG. Block-level patterns are created in separate sets of patterns, one for each clock waveform. The Mentor …

Abstract—In this paper, an on-chip clock (OCC) controller with bypass function based on an internal phase-locked loop (PLL) is designed to test the faults in system on chip (SOC), such …

DFT test-OCC circuit introduction. SCAN technology, that is, ATPG technology-testing std-logic, the main implementation tools are: generating ATPG using Mentor's TestKompress and …

DFT, Scan & ATPG. What is DFT; Fault models; Basics of Scan; How test clock is controlled for Scan Operation using On-chip Clock Controller. Why do we need OCC; How test clock is …

Sep 30, 2024 · So, to overcome these limitations, a DfT architecture is defined which generates scan reset internally using OCC. Keyphrases: DFT Architecture, Hierarchical compatible Test, …