X-ray diffraction (XRD) is a characterization technique used for the analysis of crystalline structures of solid materials, powders, thin films, nanomaterials, single crystals, and wafers. Typical applications include mineralogical identification, phase proportion calculations, in situ phase evolution, texture, crystallinity and amorphous ...

Here, Cerium-doped cobalt phosphide@nitrogen-doped carbon (Ce-doped CoP@NC) with hollow polyhedron structure materials were successfully synthesized via ionic-exchange with Co and Ce ions using...

Sep 5, 2019 · In our report, A N-doped ZIF-8-derived carbon (NC-ZIF) is synthesized at different temperatures as anode material for lithium-ions battery.

Aug 22, 2022 · X-ray diffraction is a common technique that determine a sample's composition or crystalline structure. For larger crystals such as macromolecules and inorganic compounds, it can be used to determine the structure of atoms within the sample. If the crystal size is too small, it can determine sample composition, crystallinity, and phase purity.

Jan 30, 2019 · One methodology for examining the implications of photoinduced heating in perovskites is time-resolved X-ray diffraction (TR-XRD). Through exciting above the bandgap, fast...

May 1, 2022 · The characteristic peaks of Cu and Co metal appear in the XRD pattern of Cu/NC@Co/NC-3.75, but not in Cu/NC@Co/NC-3 and Cu/NC@Co/NC-2.5, which might be caused due to the relatively small amount of Co in the composites.

Dec 1, 2018 · The X-ray diffraction (XRD) patterns were performed on a X-ray diffractometer (Rigaku, Max-3A) with Cu K α (λ = 1.54178 Å) radiation at 40 kV and 30 mA. The samples were scanned over the 2θ ranges from 10° to 90° at the scan rate of 10° min −1.

Oct 5, 2021 · Herein, a dual-linker zeolitic tetrazolate framework-engaged strategy is developed to construct assembled hollow plates (AHP) of N-rich carbon (NC), which is loaded with single-Ni atoms to form a highly efficient electrocatalyst (designated as Ni-NC (AHP)).

Fabrication of efficient CdS quantum dot sensitized solar cell with a novel stable counter electrode based on a thin film of SnO2 is revealed. The film was characterized by using Scanning Electron...

May 9, 2013 · Rigaku SmartLab X-ray diffractometer has interchangeable stages and optical components that allow 3 operating modes: 1. Bragg-Brentano in reflection geometry for solid materials. 2. Grazing incidence angle diffraction for polycrystalline thin films. 3. X-ray reflectivity for characterizing thin film thickness, roughness, and density.