Jan 1, 2001 · We describe a 19-element high-purity Ge solid-state detector array developed for high-throughput fluorescence X-ray absorption fine structure (XAFS) experiments in ultra-high vacuum (UHV). The packing ratio is 57%, a significant improvement over that of standard 13-element arrays (37%).

The static focusing optics of the existing energy-dispersive XAFS beamline BL-8 have been advantageously exploited to initiate diamond anvil cell based high-pressure XANES experiments at the...

Feb 18, 2021 · The local structures of Fe, Ni, and Ge in the lattice of tetrataenite were acquired using the XAFS method with high precision. EXAFS is an effective method for studying the local structure of iron meteorites as it provides consistent results of the lattice parameter with XRD.

May 14, 2015 · In this work, the short-range atomic structure of amorphous germanium diselenide (a-GeSe 2) is studied at both Ge and Se atomic sites by performing two-edges high-pressure XAS experiments up to...

Feb 23, 2022 · We demonstrate that the Bethe–Salpeter equation (BSE) accurately captures the NEXAFS (or XANES) portion of the spectrum for the isoelectronic series in addition to Si and Ge–Si alloys, including within a few eV of the absorption edge, where band structure and excitonic effects are most important.

Jul 29, 2009 · We describe an approach for acquiring high quality x-ray absorption fine structure (XAFS) spectroscopy spectra with wide energy range at high pressure using diamond anvil cell (DAC).

Apr 10, 2025 · The operando XAFS results revealed that the dispersion process of H 2 PtCl 6 was similar to the self-regeneration process of Pt/Ge-MFI. Aging the mixture of H 2 PtCl 6 and Ge-MFI in air at high temperature induces a gradual decomposition of H 2 PtCl 6 into PtO 2.

Jan 30, 2007 · In particular, X-ray Absorption Fine Structure (XAFS) measurements performed ex situ show that a alloy forms during deposition, with average composition varying between 0.25 and 0.50, depending on substrate temperature and total coverage.

Select “verbose headers”; Set numbers of Scans; Set proper XAFS data collection configuration, save the configuration to a file if wanted; Click “Start Scan”

To observe the structural changes, X-ray diffraction is often used for crystalline materials, but in case of amorphous materials, like glasses, X-ray absorption spectroscopy (XAFS) is better suited.