One of the most common hardware test compression technique is EDT. Tessent TestKompress is the tool that can generate the decompressor and compactor logic at the RTL level. As shown in Figure 2, the decompressor drives the scan chain inputs and the compactor connects from the scan chain outputs.

EDT Summary EDT is a natural extension to ATPG — Easy to learn and implement (similar flow to ATPG) — Obtains high quality tests with dramatic compression EDT supports — Reduction of test data volume and time — All fault models — All pattern types — X-handling without functional logic modification EDT is highly scalable

Apr 6, 2024 · What is Scan Compression, EDT and/or CoDec in DFT? Scan Compression is a DFT technique that reduces the testing time and thus cost by compressing (or reducing) the scan chain lengths.

Embedded deterministic test (EDT) is a manufacturing test paradigm that combines the compression advantage of built-in self-test with the high fault coverage of deter-ministic stimuli inherent to methods based on automatic test pattern generation and external testers. Despite enabling the use of low cost testers for rapidly achieving

Jul 3, 2001 · This document provides an overview of Embedded Deterministic Testing (EDT) implemented by Tessent TestKompress. EDT uses deterministic ATPG to achieve high test compression and reduce test time while maintaining high test quality.

Sep 24, 2015 · The new EDT Test Points are a unique technology that uses better analysis of where to insert the test points to best reduce pattern count. Figure 1 shows two control Test Point structures. There is an AND-controlled test point and OR-controlled test point.

Dec 17, 2023 · Design for testability (DFT) is a technique that adds extra logic to a circuit to improve its testability (Controllability &…

EDT (Embedded deterministic testing) is employed in order to reduce the test volume and reduced ATE memory usage due to large number of test patterns. This paper aims to determine, how well the EDT architecture performs in a DFT environment in terms of coverage for atspeed and stuck at fault model.

In this paper, we develop novel design-for-testability (DFT) structures to considerably reduce the cost of initializing the circuit during functional test.

Oct 1, 2006 · Popular scan techniques include Illinois Scan, a technique that involves connecting many internal scan chains to a common scan channel, and embedded deterministic test (EDT), which employs a combination of approaches to provide high compression while working in the presence of X states.