Employing more stress testing at the wafer level improves quality while reducing burn-in time and cost. So why isn’t it ...

In wafer sort, an electrical test is conducted on a die while it’s still on the wafer. The goal is to weed out the bad dies before they move into the IC-packaging process. From there, the wafer is ...

Hprobe today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort for High Volume Manufacturing. Contacts Media Contact: Camille Dufour/International PR Consulting camille ...

One such algorithm for wafer sort is called NNR (Nearest Neighbor Residual). Using NNR, the PAT limits for each die are determined based on the distribution of test values of the die surrounding it.

Created as an option for the proven T5835 multifunction memory test system, the new high-speed wafer-sort interface enables high-speed NAND Flash/NVM wafer probing (up to 5.4Gbps) with 4,096 full ...

For wafer-sort applications, the number of pins on the probe card necessary to support all of the device test sites, the number of board layers, etc., can cause probe-card costs to increase to ...

Wafer sorting service providers will see sales growth of more than 20% with an average utilization rate of over 80% in the third quarter, as orders from foundries are growing strong, according to ...

Prices for wafer sorting services in Taiwan may rise by 10% in the near future due to a projected 10% capacity shortage, according to sources with packaging and testing companies.

SINGAPORE–Singapore's United Test and Assembly Center Ltd. (UTAC) here today announced the grand opening of what the company claims is Southeast Asia's first 300-mm wafer sorting facility. UTAC, a ...