The brief was that the wafer probe yield was disastrous and the correlation wafer was not giving the correct results. Getting to the punch line is going to require some IC fabrication background ...

The brief was that the wafer probe yield was disastrous and the correlation wafer was not giving the correct results. Getting to the punch line is going to require some IC fabrication background ...

Plug & Play: the hybrid probe card UFO Probe® Card can be integrated into existing standard IC wafer probers without much effort. Picture made by Tobias Gnausch, Jenoptik. Plug & Play ...

Two key trends are converging on wafer probe, leading the need to rethink the industry’s approach to wafer test: at-speed testing and reducing the cost of test. The first trend is full ...

Livermore, Calif.—FormFactor Inc. has developed a family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

HSINCHU, Taiwan, Nov. 14, 2018 /PRNewswire/ -- MPI Corporation introduces a new 300 mm fully-automatic TS3500 wafer probe systems series with WaferWallet™. Over the past decade, the ...

using a Teradyne wafer probe system. Boston-based Teradyne (nyse: TER) said the evaluation was done to lay the groundwork for expanded sales of DRAM bare die and increasing use of wafer-level chip ...

NORTH READING, Mass., March 31, 2025--(BUSINESS WIRE)--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics ...