Cascade Microtech has announced enhancements to its line of Infinity probes, supporting finer pitches (down to 50 microns) and smaller contact areas (with pads as small as 25 x 25 microns) while ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a ...

Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...

Jenoptik-UFO-Probe-Card_8635@Gnausch_300dpi_cymk Plug & Play: the hybrid probe card UFO Probe® Card can be integrated into existing standard IC wafer probers without much effort. Picture made by ...

Two key trends are converging on wafer probe, ... Finally, emerging wafer-level packaging technologies will require full-performance test at probe, and package test will be eliminated.

If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card , which will connect to the ATE head with ...

This paper presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to greatly improve DC biasing accuracy, S-parameters measurement accuracy and post ...

The number of available probe pins increased by 68.96% compared to the state-of-the-art infrastructure, without compromising the application area. The experimental results demonstrate that our ...

BEAVERTON, OR--(Marketwired - Jul 8, 2014) - Cascade Microtech, Inc. (NASDAQ: CSCD), a leading supplier of solutions that enable precision measurements of integrated circuits at the wafer level ...

Smiths Interconnect has introduced a production probe head for wafer-level packages and known good die. Part of its Volta range Volta 180 is a WLCSP test connector for chips with 180um pitch IO. The ...