The Hiden IG5C high-brightness caesium ion gun produces an intense beam of caesium ions ideally suited to SIMS depth profiling, surface physics and surface modification for analysis of electronegative ...

Ion guns that fire polyatomic ions can reveal more detailed information and cause less damage to the sample. ... Secondary-ion mass spectrometry (SIMS) 4 is a leading technique for analysing surfaces.

The CAMECA NanoSIMS 50 is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion ...

Integrating a mass analyzer into a FIB-SEM microscope enables the analysis of light elements in battery research by facilitating secondary ion mass spectrometry (SIMS) imaging. The FIB's energetic ion ...

The SIMS workstation is a versatile quadrupole SIMS instrument, integrated with the MAXIM SIMS analyzer and IG20 gas ion gun. Components are also available individually, allowing the configuration of ...

ION TOF. TOF-SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, ... 25-50 keV Bismuth liquid metal Ion gun (analysis, imaging, pulsed or direct ion ...

ION TOF. TOF-SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This equipment is engineered for the ...