More information: Danielle N. Alverson et al, Distinguishing isotropic and anisotropic signals for X-ray total scattering using machine learning, Acta Crystallographica Section A Foundations and ...

New machine learning tool reveals atomic structure of ultra-thin film materials by Paris Carter, Brookhaven National Laboratory edited by Lisa Lock, reviewed by Andrew Zinin Editors' notes ...

Machine Learning Tool Reveals Atomic Structure of Ultra-Thin Film Materials A new machine-learning workflow for processing complex X-ray scattering data is helping scientists to study ultra-thin film ...