Combining an ultra-high-resolution field-emission scanning electron microscope (SEM) column with FEI's Sidewinder focused ion beam (FIB) column and gas chemistries, the Helios NanoLab achieves new ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results.

In this protocol, we describe a 3D imaging technique known as 'volume electron microscopy' or 'focused ion beam scanning electron microscopy (FIB/SEM)' applied to biological tissues. A scanning ...

Focused ion beam scanning electron microscopy, or FIB-SEM, is a scientific instrument that resembles a scanning electron microscope, or SEM. It is an important imaging technology, allowing for more ...

What if 3D tomography is performed on a limited volume and shallow depth, unearthing small grains overall? Would this be the ...

Use precise geolocation data and actively scan device characteristics for identification. This is done to store and access ...

The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The new FIB sample stage offers fast ...

Automated slicing and multibeam imaging are big throughput advancements in vEM ... Alongside an electron beam, FIB-SEM microscopes shoot high energy ions like gallium at the surface of the sample.

announces the installation of a new Thermo Scientific Helios 5 UX DualBeam Focused Ion Beam Scanning Electron Microscope. The instrument is available now for client projects and is one of the only ...