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What if 3D tomography is performed on a limited volume and shallow depth, unearthing small grains overall? Would this be the ...
Use precise geolocation data and actively scan device characteristics for identification. This is done to store and access ...
This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results.
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
An example of a correlative study between XRM and FIB-SEM has been presented in an earlier study. 1 This article will expand the correlation one step beneath the length scale to link FIB-SEM and TEM, ...
FIB or Focused Ion Beam technology has come into its own in the last couple of decades. In combination with Scanning Electron Microscopy or SEM, the FIB technique becomes more versatile and able to ...
The cell imaged by FIB-SEM/EDS consists of a yttria-stabilized zirconia (YSZ) electrolyte, a heterogeneous Ni-YSZ hydrogen electrode, a single solid phase lanthanum strontium cobalt (LSC) oxygen ...
Outfitted with an automated front-opening universal-pod loader, the Helios NanoLab 1200AT from FEI can be located inside the semiconductor wafer fab, where its SEM (scanning electron microscope) ...
ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in ...
This movie shows a 3D reconstruction of a zebrafish scale iridophore using FIB-SEM, with a high magnification view of the cell’s ultrastructure and the ~20-30 nm thick crystals running in ...
Combined with the automated alignments and improved resolution on the Helios 5 UX, samples can now be manipulated and prepared for S/TEM characterization or other FIB-SEM applications with ...