CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
The imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) can be combined with the processing ability of a focused ion beam (FIB). During imaging, milling, or ...
Furthermore, a choice of software modules, wizards and recipes make FIB-SEM applications an easy and straightforward experience for both novice and expert users.
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