The energy released during these transitions can cause the emission of another electron, known as the Auger electron. In the Auger process, the energy of these Auger electrons is characteristic of the ...
The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback