Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid ...

At the full-chip level, PathFinder verifies the placement and connectivity of ESD cells for HBM, MM, and CDM, based on layout information and design rules.

An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, especially from the completion of the silicon wafer processing to when the device is assembled ...

At our company, we used failure analysis (FA) to successfully determine what caused GaAs RF ICs to fail during retesting. In our case, the source of the damage turned out to be just as important as ...

Devices can pick up a charge from simply sliding down a feeder during packaging or assembly. Since the current during a CDM event can reach tens of Amperes, it can be far more destructive than an HBM ...

In order to yet meet the ESD targets for CDM and HBM, smart co-design of ESD protection with the SerDes transmitter circuit has become a necessity. In this white paper is firstly shown the problem in ...

At the full-chip level, PathFinder verifies the placement and connectivity of ESD cells for HBM, MM, and CDM, based on layout information and design rules. It computes the impedance in the discharge ...