This could result in delayed tape-out schedules, DFT or ATPG surprises late in the design flow, and compromises on test quality. Figure 1.

BALTIMORE Claiming a huge boost in capacity and speed, Synopsys Inc. is announcing a hierarchical capability for its Design For Test (DFT) Compiler product at this week's International Test Conference ...

Synopsys Inc. today announced it has upgraded its design-for-test (DFT) and automatic test pattern generation (ATPG) products for system-on-a-chip (SOC) design flow. The upgrades to the company’s ...

Figure 4 shows a design flow that employs DWT using a set of well-integrated tools that have strong interoperability including RTL verification, synthesis and DFT, equivalence checking, floor ...

Back when semiconductor devices contained only a few thousand gates, manufacturing test was almost an afterthought. The ...

Then, during ATPG, the tool only needs to know which scan mode to import and it takes care of the details. A common database ends up being very important from a flow usability perspective. With this ...

If this is done at ATPG level, tool generates a file with suggested control/observe Test Points. DFT Compiler/ TetraMAX: Automatic Test Point generation command/flow: In TetraMAX there is a command ...

By integrating Talus ATPG and Talus ATPG-X into the Talus physical design environment, Magma offers the only IC implementation flow that provides true physically aware DFT. The increased complexity ...

DFTView and Verdi Give DFT and Test Engineers Visibility into STIL and WGL Files March 28, 2011 04:00 AM Eastern Daylight Time ...