Then, during ATPG, the tool only needs to know which scan mode to import and it takes care of the details. A common database ends up being very important from a flow usability perspective. With this ...

Figure 4 shows a design flow that employs DWT using a set of well-integrated tools that have strong interoperability including RTL verification, synthesis and DFT, equivalence checking, floor ...

They adopted a design for test (DFT) philosophy, in which structures were designed into the chip to facilitate test. With such structures in place, automatic test pattern generation (ATPG) tools could ...

Synopsys Inc. today announced it has upgraded its design-for-test (DFT) and automatic test pattern generation (ATPG) products for system-on-a-chip (SOC) design flow. The upgrades to the company’s ...

A hierarchical DFT methodology, which breaks big designs into separate blocks for ATPG and then reuses and retargets the test to the full design later, often provides an additional 2x or better ...

Flat ATPG implies that the design is complete and the ATPG session is performed on the entire design at the same time as one “flat†view. However, for designs that are too big to perform flat ATPG, ...

By Sandeep Kaushik, Synopsys and Paul Policke, Qualcomm (02/26/08, 10:08:00 AM EST) -- EDA DesignLine With scaling technology and increasing design sizes, power consumption during test and test data ...

SynTest Technologies, Inc., established in 1990, develops IP for advanced Design-for-Test (DFT) and Design-for-Debug/Diagnosis (DFD) applications (including logic BIST, memory BIST, boundary-scan ...